Critical Dimensional Measurement Systems

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A purely peer-to-peer version of electronic cash would allow online payments to be sent directly from one party to another without going through a financial institution.Digital signatures provide part of the solution, but the main benefits are lost if a trusted third party is still required to prevent double-spending.

The network timestamps transactions by hashing them into an ongoing chain of hash-based proof-of-work, forming a record that cannot be changed without redoing the proof-of-work.

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Seeing and measuring the impossible

VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.

Critical Dimensional Measurement Systems

Pinnacle 250

The Pinnacle 250 offers the highest accuracy and fastest speeds of the VIEW line. Its high performance and compact footprint make it VIEW's most popular model.

The Pinnacle features a damped granite base and column, with passive vibration isolation. A precision compound X-Y stage with high-speed linear motor drives provides velocity of 400 mm / sec and acceleration of 1000 mm / sec2. This combination of high acceleration and high velocity enables the high throughput required for near-line process monitoring. The rugged and compact design of the Pinnacle lends itself to installation in either a Q/A lab or at an inspection station in the manufacturing line.

VIEW Metrology Software (VMS™) which offers a wide array of standard measurement tools as well as a built-in scripting language to enable custom-functions.
Elements® CAD-to-Measure software provides automatic.

Key Features and Options

The Pinnacle is ideal for measurement of small, close tolerance parts, particularly parts with a high density of features, such as hard disk drive suspensions, printer heads, precision stampings, leadframes, ball-grid arrays, and chip scale packages.

The Pinnacle can be equipped with an optional through-the-lens or offset mounted laser for added flexibility in Z-axis measurements. Pinnacle models can also utilize the optional SpectraProbe™ offering sub-micron Z-axis measurement resolution.

	Standard	Optional
X,Y,Z Travel	250x150x100 mm	624x624x200 mm
Load Capacity	25 kg
Imaging Optics	Dual magnification, fixed lens	Single magnification, fixed lens
Metrology Camera	1.4 megapixel, 1/2 inch, digital monochrome	1.4 megapixel, 2/3 inch, digital, monochrome 2.0 megapixel 1/2 inch, digital monochrome
Illumination	All LED coaxial through-the-lens surface light and below-the-stage back light	Multi-color programmable ring light Grid autofocus system
Sensor Options		Through-the-lens (TTL) laser Spectra Probe white light range sensor Off-axis triangulation laser
Measurement Modes	High Speed Move and Measure (MAM)	Continuous Image Capture (CIC)